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Bulletin of the Korean Chemical Society (BKCS)

ISSN 0253-2964(Print)
ISSN 1229-5949(Online)
Volume 28, Number 3
BKCSDE 28(3)
March 20, 2007 

Electron Crystallography of CaMoO4 Using High Voltage Electron Microscopy
Jin-Gyu Kim, Joo-Hyoung Choi, Jong-Man Jeong, Young-Min Kim, Il-Hwan Suh, Jong-Pil Kim, Youn-Joong Kim*
CaMoO4, High voltage electron microscope, Electron crystallography, X-ray crystallography
The three-dimensional structure of an inorganic crystal, CaMoO4 (space group I 41/a, a = 5.198(69) A and c = 11.458(41) A), was determined by electron crystallography utilizing a high voltage electron microscope. An initial structure of CaMoO4 was determined with 3-D electron diffraction patterns. This structure was refined by crystallographic image processing of high resolution TEM images. X-ray crystallography of the same material was performed to evaluate the accuracy of the TEM structure determination. The cell parameters of CaMoO4 determined by electron crystallography coincide with the X-ray crystallography result to within 0.033-0.040 A, while the atomic coordinates were determined to within 0.072 A.
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